The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Sep. 05, 2007
Marshall A. Beddoe, San Francisco, CA (US);
Thomas A. Maufer, Menlo Park, CA (US);
Marshall A. Beddoe, San Francisco, CA (US);
Thomas A. Maufer, Menlo Park, CA (US);
Mu Dynamics, Inc., Sunnyvale, CA (US);
Abstract
A system and method for analyzing and/or testing member devices in a multi-device system. The multi-device system includes a device-under-analysis (DUA) and a device-under-observation (DUO). An analyzer that is external to the multi-device system generates and sends test messages to the DUA. The analyzer monitors the health of the multi-device system through the DUO and detects a system-wide impact of the DUA caused by the test messages. The analyzer analyzes the DUA based on the test messages and the system-wide impact.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile