The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Aug. 30, 2007
Ronald P. Millett, Orem, UT (US);
Dillon K. Inouye, Provo, UT (US);
John C. Higgins, Orem, UT (US);
John P. Pratt, American Fork, UT (US);
Ronald P. Millett, Orem, UT (US);
Dillon K. Inouye, Provo, UT (US);
John C. Higgins, Orem, UT (US);
John P. Pratt, American Fork, UT (US);
Perfect Search Corporation, Provo, UT (US);
Abstract
Searching a data store for parameter patterns specified in a query. A method includes receiving a query from a user including N parameter patterns. One or more alternatives are associated to one or more of the N parameter patterns. One or more templates are created. Each of the templates describes a number of microsearches. Each of the microsearches includes one or more of the N parameter patterns or the alternatives. Microsearches described by at least one of the one or more templates are enumerated. One or more sub-microsearches are performed by searching for parameter patterns and/or alternatives. Each sub-microsearch may have less than all terms needed for a full microsearch. Based on the results of the one or more sub-microsearches, one or more microsearches are eliminated from searching. The data store is searched using one or more of the remaining microsearches.