The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Aug. 30, 2007
Ronald P. Millett, Orem, UT (US);
Dillon K. Inouye, Provo, UT (US);
John C. Higgins, Orem, UT (US);
Perfect Search Corporation, Provo, UT (US);
Abstract
Determining intersection points of parameter patterns. Parameter patterns are specified in a query. A method includes identifying a first parameter pattern from the query as occurring less often in the index than one other parameter pattern in the query. The data store is searched until a present location of the data store has been identified as including the first parameter pattern. Then the data store is searched for a location of another parameter pattern. If the present location is identified as including the another parameter pattern, then an indication is provided identifying an intersection. Otherwise, the method includes continuing searching remaining portions of the data store to find a location of the another parameter pattern at a new present location. At least one of the acts of searching above includes eliminating at least a portion of records of the data store from searching without being searched prior to being eliminated.