The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Dec. 29, 2005
Michael J. Horstmanshof, Shorenline, WA (US);
Adam M. Feldstein, Seattle, WA (US);
Gordon A. Barnes, Woodinville, WA (US);
Peter J. Hanus, Bellevue, WA (US);
Paul A. Hagger, Redmond, WA (US);
Zachary A. Proffitt, Duvall, WA (US);
Michael J. Horstmanshof, Shorenline, WA (US);
Adam M. Feldstein, Seattle, WA (US);
Gordon A. Barnes, Woodinville, WA (US);
Peter J. Hanus, Bellevue, WA (US);
Paul A. Hagger, Redmond, WA (US);
Zachary A. Proffitt, Duvall, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Systems and methods are provided to enable viewing and computation of differential data for an item or item subset when compared with other items or subsets. A score may be determined for an item or subset where standard deviations and distance metrics are computed to determine differentiators. In one aspect, a system for comparing data items is provided. The system includes a weighting component to determine a score for an item or subset of items. A differentiator component determines a comparison metric for the item or subset of items based in part on a distance metric to at least one other item or subset of items. A user interface can be provided to display the comparison metrics.