The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Aug. 23, 2007
Applicant:

Peter Renner, D-51515 Kurten, DE;

Inventor:

Peter Renner, D-51515 Kurten, DE;

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a method for monitoring measurement data by way of measurement channels. The measurement channels are processed in a plurality of time series of state values with mutually different time bases. Limit value ranges are ascertained in a learning phase and monitoring-related steps are triggered in a monitoring phase when limit values are exceeded. A good value extent is calculated for a time series with an upper and a lower limit value, with the inclusion of a limit value range which is predetermined in the learning phase and a state base value of the time series, which is determined in the monitoring phase.


Find Patent Forward Citations

Renner, Peter. (2010). State monitoring of machines and technical installations (U.S. Patent No. 7774165). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7774165

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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