The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Sep. 28, 2006
Applicants:

Osamu Toyama, Kakogawa, JP;

Toshio Norita, Mishima-gun, JP;

Inventors:

Osamu Toyama, Kakogawa, JP;

Toshio Norita, Mishima-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a modeling technique with improved modeling accuracy. A modeling system obtains a plurality of pieces of measurement data by measuring an object a plurality of times, and obtains a standard model as a standard three-dimensional model of the object. The modeling system deforms the standard model so as to optimize a predetermined evaluation function including an evaluation element on the plurality of pieces of measurement data, thereby generating a three-dimensional model of the object.


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Toyama, Osamu. (2010). Modeling system, and modeling method and program (U.S. Patent No. 7773798). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7773798

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