The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Feb. 15, 2006
Guangjun Zhang, Beijing, CN;
Dazhi Chen, Beijing, CN;
Ying Wang, Beijing, CN;
Fuqiang Zhou, Beijing, CN;
Zhenzhong Wei, Beijing, CN;
Guangjun Zhang, Beijing, CN;
Dazhi Chen, Beijing, CN;
Ying Wang, Beijing, CN;
Fuqiang Zhou, Beijing, CN;
Zhenzhong Wei, Beijing, CN;
Beijing University of Aeronautics and Astronautics, Beijing, CN;
Abstract
The present invention relates to a high-performance computer vision system and method for measuring the wings deformation of insects with high flapping-frequency, large stroke-amplitude and excellent mobility during free-flight. A geometrical optic unit composed of a polyhedral reflector with four reflection-planes and four planar reflectors is used to image one high-speed CMOS camera to four virtual cameras, combined with double laser-sheet sources, multiple virtual stereo and structured-light sensors are available to observe the free-flight of insect at different viewpoints simultaneously. In addition, an optoelectronic guiding equipment is included to lead the free-flight of insect and trigger the camera to capture the image sequences of insect-flight automatically. The deformation of insect-wings can be reconstructed by the spatial coordinates of wing-edges and the distorted light-lines projected on the surface of wings.