The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Oct. 28, 2008
Clarence L. Gordon, Iii, Renton, WA (US);
Richard H. Bossi, Renton, WA (US);
John L. Adamski, Kenmore, WA (US);
Clarence L. Gordon, III, Renton, WA (US);
Richard H. Bossi, Renton, WA (US);
John L. Adamski, Kenmore, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method and apparatus for multi-energy object inspection using a brilliant x-ray source. A first mono-energetic x-ray image of an object at a first selected energy is generated. A second mono-energetic x-ray image of the object at a second selected energy is generated. The first selected energy is different than the second selected energy. Additional mono-energetic x-ray images may be generated at energies different than previous energies up to n selected energies. The mono-energetic x-ray images are mathematically combined and processed to form a result. The result of processing the mono-energetic x-ray images is presented. The result comprises processed mono-energetic x-ray image data describing materials in the object with greater sensitivity, identifying the layers, and identifying the material composition than in the first image or the second image.