The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Feb. 29, 2008
Applicant:

Paul Stephan Bedrosian, Andover, MA (US);

Inventor:

Paul Stephan Bedrosian, Andover, MA (US);

Assignee:

Agere Systems Inc., Allentown, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G06F 11/00 (2006.01); G08C 15/00 (2006.01); H04J 1/16 (2006.01); H04J 3/14 (2006.01); H04L 1/00 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention provide packet timing recovery stress testing by generating packet delay variation (PDV) with a uniformly distributed probability density function (PDF). A delay-step method determines a delay for each packet in a stream of packets generated at a regular interval. In the delay-step method, delay-steps are determined for each packet based on delay target values. To generate PDV with a uniform PDF, the delay target values are randomly selected based on a pre-biased PDF which is a uniform distribution that is pre-biased by a pre-bias function. The pre-bias function increases the values of small delay target values so that an increased number of delay target values are at the extremes of the uniform distribution, which causes the delay-step method to result in a PDV with a uniform distribution.


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