The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Jan. 07, 2004
Applicants:

William R. Haas, Fort Collins, CO (US);

Kirk S. Tecu, Greeley, CO (US);

James S. Voss, Fort Collins, CO (US);

Inventors:

William R. Haas, Fort Collins, CO (US);

Kirk S. Tecu, Greeley, CO (US);

James S. Voss, Fort Collins, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems are disclosed for detecting an unwanted artifact in an image scanner. An exemplary system includes a treated component of the image scanner, the treated component treated such that light reflects differently from the treated component than light reflected by an image being scanned by the image scanner. The light reflected from the treated component facilitates detection and removal of the unwanted artifact in the image being scanned, the unwanted artifact caused by the light reflected by the treated component.


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