The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Jun. 18, 2007
Applicants:

Zhiling Xu, Grand Rapids, MI (US);

Peter G. Vanderjagt, Belmont, MI (US);

Steven Henry Peterson, Wyoming, MI (US);

Inventors:

Zhiling Xu, Grand Rapids, MI (US);

Peter G. VanderJagt, Belmont, MI (US);

Steven Henry Peterson, Wyoming, MI (US);

Assignee:

X-Rite, Inc., Grand Rapids, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A color measurement device designed for use at various stages of an industrial process is provided. The device offers enhanced insensitivity to ambient light, measurement depth variations, and/or ambient or environmental temperature variations. The device may be embodied as an LED-based, non-contact color measurement spectrophotometer. Over-illumination in full-spectrum of the target object facilitates effective color measurements over varying depths of view. Collected light is measured at discrete wavelengths across the entire visual spectrum. The hardened, rugged design and packaging of the measurement device allows color measurement to be performed at various stages of industrial processes wherein the device can add value by enabling enhanced detection of color errors.


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