The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Mar. 01, 2005
Applicants:

Christopher B. Svec, Palatine, IL (US);

Douglas M. Essex, Elgin, IL (US);

Inventors:

Christopher B. Svec, Palatine, IL (US);

Douglas M. Essex, Elgin, IL (US);

Assignee:

Northrop Grumman Corporation, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus is provided for selectively attenuating narrowband high intensity bright sources from an incoming light source in an imaging system creating a focal plane array. The method comprises receiving and conditioning incoming light in a at least one group of optics; receiving the into a line attenuation tunable optical filter (LATOF) which creates a rejection band; tilting the LATOF at least one increment to selectively attenuate the bright sources from the receive conditioned light; receiving the conditioned light and selectively attenuated light into an opto-electronic detector; and converting the light into an output for an electronic image, wherein saturation of the focal plane array decreases and contrast is restored in the electronic image.


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