The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Aug. 17, 2007
Applicant:
Takahiro Nagata, Gunma, JP;
Inventor:
Takahiro Nagata, Gunma, JP;
Assignee:
Yokowo Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
Abstract
A contact probe includes a plurality of probes, each of the probes including: an conductive tube; an conductive plunger, contained in at least one end side of the tube, and having a distal end part protruding outward from the tube in an axial direction of the tube; and a coil spring, contained in the tube, and adapted to elastically urge the plunger outward. The plural probes are arranged in a first direction in a socket comprised of insulating material. A cross section of the tube in a direction perpendicular to the axial direction of the tube has a greater size in a direction different from the first direction than a size in the first direction.