The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Jul. 21, 2009
Applicants:

Takeshi Sakuma, Nagoya, JP;

Kyosuke Katsuyama, Nagoya, JP;

Kenshin Kitoh, Nagoya, JP;

Inventors:

Takeshi Sakuma, Nagoya, JP;

Kyosuke Katsuyama, Nagoya, JP;

Kenshin Kitoh, Nagoya, JP;

Assignee:

NGK Insulators, Ltd., Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01R 27/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

There are disclosed an instrument for measuring the concentration of particulates in a fluid, which is capable of determining the concentration of the particulates in the fluid with high accuracy. The instrument for measuring the concentration of the particulates in the fluid includes particulate collecting means, temperature measuring means, flow rate measuring means, impedance measuring means, time measuring means, constant determining means for determining an impedance change per unit time-particulate concentration constant from temperature and flow rate, impedance change per unit time computing means for computing the change of an impedance per unit time, and particulate concentration determining means for determining the concentration of the particulates from the change of the impedance per unit time computed by the impedance change per unit time computing means.


Find Patent Forward Citations

Loading…