The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Dec. 09, 2009
Yutaka Suzuki, Hitachi, JP;
Masahiro Koike, Hitachi, JP;
Tetsuya Matsui, Hitachi, JP;
Kojirou Kodaira, Hitachinaka, JP;
Katsumi Isaka, Mito, JP;
Mitsuru Odakura, Hitachi, JP;
Kenji Tayama, Mito, JP;
Kazuhiro Suzuki, Hitachi, JP;
Kenji Kumasaka, Hitachi, JP;
Yuuji Adachi, Hitachi, JP;
Yutaka Suzuki, Hitachi, JP;
Masahiro Koike, Hitachi, JP;
Tetsuya Matsui, Hitachi, JP;
Kojirou Kodaira, Hitachinaka, JP;
Katsumi Isaka, Mito, JP;
Mitsuru Odakura, Hitachi, JP;
Kenji Tayama, Mito, JP;
Kazuhiro Suzuki, Hitachi, JP;
Kenji Kumasaka, Hitachi, JP;
Yuuji Adachi, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Engineering & Services Co., Ltd., Ibaraki, JP;
Abstract
The eddy current testing apparatus includes a probe having an eddy current testing sensor including a pair of eddy current testing coils. The apparatus also includes an eddy current testing flaw detector inputting detection signals from the eddy current testing sensor. The diameter of a magnetic core used in each of the pair of eddy current testing coils is within the range of 0.1 mm to 0.5 mm.