The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Jul. 30, 2008
Applicants:

Jung UG an, Cheonan-Si, KR;

Wan Hee Choi, Cheonan-Si, KR;

Hae Jun Park, Asan-Si, KR;

Kyeong Tae Kim, Suwon-Si, KR;

Inventors:

Jung Ug An, Cheonan-Si, KR;

Wan Hee Choi, Cheonan-Si, KR;

Hae Jun Park, Asan-Si, KR;

Kyeong Tae Kim, Suwon-Si, KR;

Assignee:

Mirae Corporation, Cheonan-si, Chungcheongnam-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test handler includes a loading unit including a loading picker and a loading ascending/descending unit, an unloading unit including an unloading picker and an unloading ascending/descending unit, and a chamber system. A passage site connects the loading unit and the chamber system, and also connects the chamber system and the unloading unit. The arrangement of the handler reduces the time for the loading and unloading processes by performing the loading and unloading processes on separate test trays located at separate loading and unloading positions.


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