The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Feb. 26, 2008
Chul-woong Jang, Cheonan-si, KR;
Seung-ho Jang, Cheonan-si, KR;
Jae-il Lee, Yongin-si, KR;
Young-jin Lee, Seongnam-si, KR;
Chul-woong Jang, Cheonan-si, KR;
Seung-ho Jang, Cheonan-si, KR;
Jae-il Lee, Yongin-si, KR;
Young-jin Lee, Seongnam-si, KR;
Abstract
Automatic test equipment is capable of performing a high-speed test of semiconductor devices, with a low cost and high efficiency. The automatic test equipment (ATE) comprises: an ATE body configured to electrically test semiconductor devices; a field programmable gate array (FPGA) controlling drivers and comparators on the ATE; an accelerator connected to an output terminal of the FPGA and that doubles an operating frequency of the FPGA; and a decelerator connected to an output terminal of the FPGA and that converts an operating frequency of data transferred from the semiconductor device to the operating frequency of the FPGA.