The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
May. 18, 2007
William D. Herzog, Groton, MA (US);
Antonio Sanchez-rubio, Lexington, MA (US);
Gregory G. Cappiello, Windham, NH (US);
Ronald H. Hoffeld, Cambridge, MA (US);
Shane M. Tysk, Arlington, MA (US);
Vincenzo Daneu, Woburn, MA (US);
Thomas H. Jeys, Lexington, MA (US);
William D. Herzog, Groton, MA (US);
Antonio Sanchez-Rubio, Lexington, MA (US);
Gregory G. Cappiello, Windham, NH (US);
Ronald H. Hoffeld, Cambridge, MA (US);
Shane M. Tysk, Arlington, MA (US);
Vincenzo Daneu, Woburn, MA (US);
Thomas H. Jeys, Lexington, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
Particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the various portions of the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.