The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Apr. 11, 2006
Applicant:

David A. Luce, Clarence Center, NY (US);

Inventor:

David A. Luce, Clarence Center, NY (US);

Assignee:

Reichert, Inc., Depew, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Tear film is measured without contacting the eye by comparing reflectance from the eye when the tear film is undisturbed with reflectance from the eye when the when the tear film is disturbed. If the reflectance levels differ somewhat, it is an indication that a healthy tear film exhibiting good specular reflection was present initially and was disturbed by the air pulse. However, if the reflectance levels are close to one another, it is an indication that a less-than-normal tear film was present initially (dry eye). In a described embodiment, tear film is disturbed by an air pulse directed at the eye, and a photosensitive detector is positioned to receive light from an illumination beam after the beam is reflected by the eye to generate a reflectance signal. The reflectance signal is evaluated to calculate a tear film index.


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