The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Jul. 22, 2004
Hans-joachim Polland, Wolfratshausen, DE;
Stefan Seitz, Germering, DE;
Kristian Hohla, Vaterstetten, DE;
Gerhard Youssefi, Landshut, DE;
Ernst Hegels, Kirchheim, DE;
Birte Jansen, München, DE;
Christoph Sappel, Grünwald, DE;
Hans-Joachim Polland, Wolfratshausen, DE;
Stefan Seitz, Germering, DE;
Kristian Hohla, Vaterstetten, DE;
Gerhard Youssefi, Landshut, DE;
Ernst Hegels, Kirchheim, DE;
Birte Jansen, München, DE;
Christoph Sappel, Grünwald, DE;
Bausch & Lomb Incorporated, Rochester, NY (US);
Abstract
A selectively marked contact lens having, in one aspect, marks in an optical zone region on a surface thereof and, in another aspect, different marks outside an optical zone region of the lens, for an in-vivo lens. With the lens in-vivo, the subject's eye is illuminated and the lens is imaged. A fast algorithm is used to determine the mark coordinates in relation to a measured pupil coordinate to determine position and/or orientation of the contact lens. A wavefront aberration measurement can also be obtained simultaneously with the contact lens position measurement, as well as pupil size. A fast algorithm provides for online measurements; i.e., at a repetition rate of 10 Hz or greater, over a selected time interval. Blinking periods are determined and anomalous lens position and/or wavefront information is discarded. A most frequently occurring wavefront and/or contact lens position/orientation is determined over the selected time interval.