The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Apr. 02, 2007
Naoto Honda, Okazaki, JP;
Shigekazu Takada, Gamagori, JP;
Kazuhiro Yoshimura, Toyohashi, JP;
Naoki Isogai, Nishio, JP;
Akihiro Hayashi, Toyokawa, JP;
Naoto Honda, Okazaki, JP;
Shigekazu Takada, Gamagori, JP;
Kazuhiro Yoshimura, Toyohashi, JP;
Naoki Isogai, Nishio, JP;
Akihiro Hayashi, Toyokawa, JP;
Nidek Co., Ltd., Gamagori-shi, JP;
Abstract
To provide an ophthalmic apparatus capable of performing efficient measurement of a plurality of eye characteristics of an examinee's eye, which comprises a first measurement unit comprising a first measurement system for performing measurement of a first characteristic of the eye, a second measurement unit comprising a second measurement system for performing measurement of a second characteristic of the eye, a measurement unit in which the measurement units are placed such that heights of first and second measurement axes of the respective systems are different from each other, a movement mechanism unit moving the measurement unit in a vertical direction, and a control unit controlling the mechanism unit such that the height of the first measurement axis at the time of first measurement by the first measurement unit becomes almost the same as that of the second measurement axis at the time of second measurement by the second measurement unit.