The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Mar. 06, 2006
Applicants:

Tokuji Okumura, Hasuda, JP;

Kazushiro Wakabayashi, Tsu, JP;

Mitsutaka Igaue, Utsunomiya, JP;

Hisashi Masuda, Koganei, JP;

Yutaka Ebato, Utsunomiya, JP;

Masahiko Nakayama, Utsunomiya, JP;

Inventors:

Tokuji Okumura, Hasuda, JP;

Kazushiro Wakabayashi, Tsu, JP;

Mitsutaka Igaue, Utsunomiya, JP;

Hisashi Masuda, Koganei, JP;

Yutaka Ebato, Utsunomiya, JP;

Masahiko Nakayama, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60R 21/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A front face distance is obtained by measuring the position of a front face of an instrument panel held by an end effecter of a robot. An error on an optical axis, at the position of the front face is obtained based on the front face distance. Based on the error, the position of the instrument panel is adjusted so that a focal point of a laser meets the position at a predetermined depth defined with the front face as the standard. A back face of the instrument panel is irradiated with a laser to form a fine hole of a fragile section.


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