The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Feb. 24, 2009
Kazuaki Tabata, Kanagawa, JP;
Hiroshi Kojima, Kanagawa, JP;
Kazuya Hongo, Kanagawa, JP;
Takayuki Yamada, Kanagawa, JP;
Seiichi Takagi, Kanagawa, JP;
Tetsuo Ohta, Kanagawa, JP;
Masaki Hirota, Kanagawa, JP;
Kazuaki Tabata, Kanagawa, JP;
Hiroshi Kojima, Kanagawa, JP;
Kazuya Hongo, Kanagawa, JP;
Takayuki Yamada, Kanagawa, JP;
Seiichi Takagi, Kanagawa, JP;
Tetsuo Ohta, Kanagawa, JP;
Masaki Hirota, Kanagawa, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
A classifying device for classifying particles using a centrifugal force contains a microchannel includes a curved portion including a first tubular channel and a second tubular channel; and a diaphragm that is provided within the curved portion, and that is located at a position between the first tubular channel and the second tubular channel; and wherein the diaphragm has at least a first apertured group formed in a central region of the diaphragm and a second apertured group formed in a first end region and a second end region of the diaphragm, the first apertured group and the second apertured group communicate the first tubular channel with the second tubular channel along a direction of the centrifugal force, the first apertured group has a mesh, and the second apertured group has a mesh that is different in size from the mesh of the first apertured group.