The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Nov. 06, 2007
Applicant:

Seong-gi Baek, Pleasanton, CA (US);

Inventor:

Seong-Gi Baek, Pleasanton, CA (US);

Assignee:

Rheosense, Inc., San Ramon, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 11/08 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A micro-rheometer for measuring flow characteristics such as viscosity, elasticity, and flow rate of a sample liquid combines well defined micro-fabricated flow channels having geometry changes forming a constriction region therein to a monolithically fabricated pressure sensor arrays. The pressure sensor array positions pressure sensors to measure the viscosity of the sample liquid while flowing in a uniform length of the flow passage and to measure the extensional viscosity while flowing through the constriction region of the passage. The invention can improve the measurement accuracy of the flow rate, viscosities, or elasticities over a wide range of shear rate. The accuracy of the viscosity over a broader range of shear rate or flow rate measurement over broader range of flow rates can be accomplished by employing monolithically integrated pressure sensors fabricated with different sensitivities disposed in a known manner. The invention further includes necessary components such as a display, a pumping system, valve manifolds, and software for a portable or laboratory measurement instrument, process control, and high throughput measurements.


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