The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2010

Filed:

Dec. 01, 2006
Applicants:

Micheal E. Bappe, Loveland, CO (US);

Helen S. Raizen, Jamaica Plain, MA (US);

Edward L. Thigpen, Raleigh, NC (US);

Inventors:

Micheal E. Bappe, Loveland, CO (US);

Helen S. Raizen, Jamaica Plain, MA (US);

Edward L. Thigpen, Raleigh, NC (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are provided for maintaining data integrity in the event of device write failures during a non-disruptive migration. In one embodiment, a computer-implemented method is provided. According to the method, a filter driver in a kernel may clone an application write to both a source storage device and a target storage device. The method may detect whether the cloned application write to the source storage device or the cloned application write to target storage device failed. When the cloned application write to the source storage device or the cloned application write to target storage device failed, the method may allow application reads from only one of the source storage device and the target storage device thereafter.


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