The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Mar. 21, 2006
Shawn Searles, Austin, TX (US);
Scott C. Johnson, Round Rock, TX (US);
Donald Walters, Austin, TX (US);
Ravinder Rachala, Austin, TX (US);
Shawn Searles, Austin, TX (US);
Scott C. Johnson, Round Rock, TX (US);
Donald Walters, Austin, TX (US);
Ravinder Rachala, Austin, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
Clock skew may be detected measured and compensated for using phase detectors and variable delay adjusters. Phase detectors may be distributed throughout a clock distribution network and may be configured to analyze two clock signals to determine how often one signal leads the other. The output of the phase detectors may be measured and counted over a large number of clock cycles. The difference between the number of times one signal leads or lags behind the other may be used to determine the amount of delay to apply to the leading clock signal in order to minimize (reduce) skew between the two clock signals. The same techniques for detecting and measuring clock skew may also be used to detect and measure jitter in the clock signals. By configuring variable delay adjusters on clock signals, the amount of jitter in the clock signals can be measured or characterized.