The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2010

Filed:

Jun. 22, 2009
Applicants:

Fumihiko Kitayama, Kanagawa-ken, JP;

Hirofumi Matsuzawa, Kanagawa-ken, JP;

Masayuki Numao, Kanagawa-ken, JP;

Madoka Yuriyama, Kanagawa-ken, JP;

Inventors:

Fumihiko Kitayama, Kanagawa-ken, JP;

Hirofumi Matsuzawa, Kanagawa-ken, JP;

Masayuki Numao, Kanagawa-ken, JP;

Madoka Yuriyama, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is an object of the present invention to find out parts to be a highly possible cause of failure without searching all of part data of all of products. Dispersed parts data on a parts tree are sequentially accessed from a set of known failed products, and part attribute values each having a higher support in the faulty product are extracted. In this process, a subset of parts used in the faulty product is also obtained simultaneously. The part attribute values having higher supports and the subset of parts used in the faulty product are represented as a tree in which a parts type serves as a node. Next, an information gain of a rule that having the two part attribute values is a cause of failure is calculated on two part attribute values having higher supports on the tree of the parts type. This calculation is locally performed on a common parent part of two parts and parts having a certain information gain is outputted as a cause of failure. How to select these two part attributes is performed in such a way that part attributes located closer to each other on the tree are first evaluated, and first found part attributes are made a candidate of a cause of failure.


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