The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Aug. 24, 2007
Kyozo Fujita, Hamburg, DE;
Hiroyuki Fujino, Kakogawa, JP;
Yoshihiro Mishima, Kobe, JP;
Sysmex Corporation, Kobe, JP;
Abstract
A measurement information display method includes: generating measurement information of a sample according to progress of measurement of the sample by a measurement unit for measuring the sample, and accumulating the measurement information in a storage part, the measurement information including state information indicating a state of the measurement by the measurement unit; accepting extracting information including an extracting condition regarding the state of measurement of the sample used in extracting the accumulated measurement information, and storing the extracting information in a memory; accepting a selection of the extracting information stored in the memory; extracting the measurement information from the accumulated measurement information according to the selected extracting information; and displaying the extracted measurement information.