The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Jul. 10, 2007
William F. Kappauf, Spokane, WA (US);
Barry E. Blancha, Boxborough, MA (US);
Tetsuro Nakao, Kagoshima, JP;
William F. Kappauf, Spokane, WA (US);
Barry E. Blancha, Boxborough, MA (US);
Tetsuro Nakao, Kagoshima, JP;
Asterion, Inc., Marlborough, MA (US);
Abstract
A waveform generation and measurement module that may be used in automated test equipment. The waveform generation and measurement module includes high speed SERDES (or other shift registers) that are used to digitally draw a test waveform. Additional high speed SERDES may also be used to receive (in serial form) a response waveform from a device under test and convert it to parallel data for high speed processing. The waveform generation and measurement module may be implemented in field programmable gate array logic.