The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Jan. 11, 2006
Applicants:
Koji Hyodo, Ibaraki, JP;
Chao-nan Xu, Saga, JP;
Inventors:
Koji Hyodo, Ibaraki, JP;
Chao-Nan Xu, Saga, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01); G01L 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A stress analysis method uses a thermoelastic stress measurement device to measure measuring stress state acting on an object by measuring material temperature state variation caused by stress, a mechanoluminescence measurement device to measure measuring stress state acting on the object by measuring light emitted from mechanoluminescence material according to the stress and an arithmetic processing device to obtain mechanical information, which includes prescribed stress distribution, by performing arithmetic processing on both the measurement data.