The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Jul. 08, 2004
Applicant:
Hee Wong, San Jose, CA (US);
Inventor:
Hee Wong, San Jose, CA (US);
Assignee:
National Semiconductor Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01);
U.S. Cl.
CPC ...
Abstract
Testing of a wireless transceiver employs a selectively activated multi-subcarrier test vector or corresponding waveform for which all subcarriers are activated except subcarriers below a selected subcarrier fundamental and harmonics of the selected subcarrier fundamental. Use of selectively activated multi-subcarrier testing allows measurement of inter-modulation distortion, harmonic distortion, frequency response, and phase noise using a common spectrum analyzer, with individual results pinpointing sources of impairment.