The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Sep. 24, 2008
Applicants:
Hajime Nakata, Kanagawa, JP;
Katsumi Hirabayashi, Tokyo, JP;
Inventors:
Hajime Nakata, Kanagawa, JP;
Katsumi Hirabayashi, Tokyo, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/04 (2006.01); H05G 1/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
An X-ray imaging apparatus is disposed with an imaging table that includes an imaging surface with which a breast of an examinee in an upright posture is brought into contact and handles that are disposed higher than the imaging surface during craniocaudal imaging. Grip portions of the handles slant so as to gradually become closer to a chest wall contacting portion as the grip portions approach the imaging surface. Thus, when an examinee is made to grasp the handles, the posture of the examinee can be made more natural.