The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2010

Filed:

Mar. 27, 2006
Applicants:

Naoki Kitagaki, Ibaraki, JP;

Makoto Miyamoto, Ibaraki, JP;

Makoto Iimura, Ibaraki, JP;

Satoshi Sukada, Ibaraki, JP;

Inventors:

Naoki Kitagaki, Ibaraki, JP;

Makoto Miyamoto, Ibaraki, JP;

Makoto Iimura, Ibaraki, JP;

Satoshi Sukada, Ibaraki, JP;

Assignee:

Hitachi Maxell, Ltd., Ibaraki-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 15/52 (2006.01);
U.S. Cl.
CPC ...
Abstract

The reproduction durability of an optical recording medium is evaluated highly accurately in a short period of time by providing a method for evaluating the optical recording medium, the method including determining an operating laser power for heating a recording layer to a recording operating temperature; determining a temperature of the recording layer when a laser beam having a predetermined reproducing laser power is radiated during a data reproduction; determining a relationship between the reproducing laser power during the data reproduction and a reproduction durability times at the reproducing laser power; and determining a relationship between the temperature of the recording layer during the data reproduction and the reproduction durability times from the relationship between the reproducing laser power during the data reproduction and the reproduction durability times.


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