The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Feb. 03, 2006
Applicants:
Fred F. Froehlich, Baltimore, MD (US);
David B. Nichols, Columbia, MD (US);
Inventors:
Fred F. Froehlich, Baltimore, MD (US);
David B. Nichols, Columbia, MD (US);
Assignee:
Northrop Grumman Systems Corporation, Los Angeles, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/30 (2006.01); G02B 27/10 (2006.01); H04J 14/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An optical tapped delay line device in accordance with the present invention is a method for and device for spatially resolving the spectral components of an optical signal, i.e., channelizing or spectrum analyzing the wavelength content of an optical signal. The device is based on a tapped optical delay line and enables numerous related optical signal processing functions.
Froehlich, Fred. (2010). Long time aperture optical tapped delay line (U.S. Patent No. 7768709). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7768709
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile