The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Aug. 20, 2004
Jiro Suzuki, Tokyo, JP;
Yoshihito Hirano, Tokyo, JP;
Yutaka Ezaki, Tokyo, JP;
Yasushi Horiuchi, Tokyo, JP;
Masaki Tabata, Tokyo, JP;
Kouji Namura, Tokyo, JP;
Izumi Mikami, Tokyo, JP;
Jiro Suzuki, Tokyo, JP;
Yoshihito Hirano, Tokyo, JP;
Yutaka Ezaki, Tokyo, JP;
Yasushi Horiuchi, Tokyo, JP;
Masaki Tabata, Tokyo, JP;
Kouji Namura, Tokyo, JP;
Izumi Mikami, Tokyo, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
A phase difference detecting device includes a splitter for splitting laser beams into a first group which will travel along a first path and a second group which will travel along a second path, a beam selection/extraction unit for selecting, as reference light, one beam from the first group to allow it to pass therethrough, a path length changing unit for changing the length of the first path, a combining unit for combining the reference light and beams which construct the second group to produce interference light, and a detector for detecting the intensity of the interference light. The device changes the length of the first path using the path length changing unit to detect a path length which maximizes the intensity of the interference light for each of the beams which construct the second group, and determines a phase difference among the beams from the detected path length.