The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Mar. 02, 2005
Shunichi Kimura, Ashigarakami-gun, JP;
Masahiro Kato, Ashigarakami-gun, JP;
Hiroaki Ikegami, Ashigarakami-gun, JP;
Hideaki Ashikaga, Ashigarakami-gun, JP;
Katsuhiko Itonori, Ashigarakami-gun, JP;
Masanori Satake, Ebina, JP;
Hiroki Yoshimura, Ashigarakami-gun, JP;
Shunichi Kimura, Ashigarakami-gun, JP;
Masahiro Kato, Ashigarakami-gun, JP;
Hiroaki Ikegami, Ashigarakami-gun, JP;
Hideaki Ashikaga, Ashigarakami-gun, JP;
Katsuhiko Itonori, Ashigarakami-gun, JP;
Masanori Satake, Ebina, JP;
Hiroki Yoshimura, Ashigarakami-gun, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
An image reading apparatus has a scan quality parameter extraction part, a scan quality evaluation part and a notification part. The scan quality parameter extraction part extracts scan quality parameters representing the quality of a scanned image from image data based on a scan error detection algorithm. The scan quality evaluation part determines whether a scan error occurs, based on the scan error detection algorithm and the scan quality parameters. Also, the notification part notifies a result determined by the scan quality evaluation part to a user.