The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2010

Filed:

Aug. 15, 2007
Applicants:

Ya-hui Tsai, Taoyuan County, TW;

Tung-chuan Wu, Hsinchu, TW;

Chun-hsien Liu, Taipei, TW;

Inventors:

Ya-Hui Tsai, Taoyuan County, TW;

Tung-Chuan Wu, Hsinchu, TW;

Chun-Hsien Liu, Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An anomaly detection system and a method thereof are disclosed. The system comprises at least a light reflecting unit, a light-emitting unit, an image pick-up unit and a processing module. Each of the light reflecting unit is disposed on an object-to-be-detected that all of which are capable of reflecting light emitted from the light-emitting unit and thus cooperatively generating a reflection image relating to the object-to-be-detected to be received by the image pick-up unit for enabling the same to generate an image signal accordingly. The image signal is then transmitted to the processing module where it is analyzed and compared with a standard image signal so as to determine whether the position of the object-to-be-detected is abnormal.


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