The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Dec. 20, 2006
Applicants:
Steven Robert Hayashi, Niskayuna, NY (US);
Zhongguo LI, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Jianming Zheng, Shanghai, CN;
Howard Paul Weaver, Mason, OH (US);
Xiaoming Du, Shanghai, CN;
Tian Chen, Shanghai, CN;
Inventors:
Steven Robert Hayashi, Niskayuna, NY (US);
Zhongguo Li, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Jianming Zheng, Shanghai, CN;
Howard Paul Weaver, Mason, OH (US);
Xiaoming Du, Shanghai, CN;
Tian Chen, Shanghai, CN;
Assignee:
General Electric Company, Schenectady, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of measuring an object includes positioning the object on a moveable stage, performing a rotary scan of the object with a range sensor, and determining geometric parameters of the object based on the rotary scan.