The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
May. 02, 2007
Xiquan Cui, Pasadena, CA (US);
Xin Heng, Pasadena, CA (US);
Changhuei Yang, Pasadena, CA (US);
Axel Scherer, Laguna Beach, CA (US);
Demetri Psaltis, Saint Sulpice, CH;
Xiquan Cui, Pasadena, CA (US);
Xin Heng, Pasadena, CA (US);
Changhuei Yang, Pasadena, CA (US);
Axel Scherer, Laguna Beach, CA (US);
Demetri Psaltis, Saint Sulpice, CH;
California Institute of Technology, Pasadena, CA (US);
Abstract
A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface plasmon assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile