The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Jun. 26, 2008
Yoshihiro Ishibe, Utsunomiya, JP;
Yoshihiro Ishibe, Utsunomiya, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A multi-beam optical scanning device which enables uniform scan line pitch and high precision image, includes a light source having plural light emitting members, a rotary polygonal mirror having a deflecting surface, a first optical system for imaging a light beam on the deflecting surface and a second optical system for imaging the light beam on a scan surface to be scanned, wherein the optical axis of the first optical system is disposed at a particular angle in a sub-scan section with respect to a plane perpendicular to the deflection axis of the deflecting surface, and wherein, with respect to the imaging magnification in the sub-scan section of the second optical system on the optical axis and between the deflecting surface and the scan surface, the imaging magnification at a scan start side is made large while the imaging magnification at the scan end side is made small or, alternatively, the imaging magnification at a scan start side is made small while the imaging magnification at the scan end side is made large.