The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2010

Filed:

Jun. 09, 2009
Applicants:

Eric Davis, El Cerrito, CA (US);

Scott Marsic, San Francisco, CA (US);

Inventors:

Eric Davis, El Cerrito, CA (US);

Scott Marsic, San Francisco, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for representing surface deformation measurements, including providing InSAR data, wherein the InSAR data is line of sight InSAR data; providing Global Positioning System (GPS) data; filtering the InSAR data; assembling the GPS data over a time span; resolving the GPS data into a line of sight direction; determining a correction; generating a corrected line of sight image; generating a plurality of XY motion maps, wherein generating includes: correlating a plurality of XY motions from a plurality of GPS sites with a gradient of the corrected line of site image; determining a correlation coefficient; and building a plane of XY motion using at least one of the plurality of XY motions; using the correlation coefficient to produce a linear combination of the plurality of XY motion maps; and using the linear combination to convert the InSAR data to vertical motion.


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