The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Sep. 06, 2006
David Dobsky, Houston, TX (US);
David Dobsky, Houston, TX (US);
Metrix Instrument Co., L.P., Houston, TX (US);
Abstract
A digital based two wire proximity transmitter system and a method for calibrating the system, wherein the transmitter includes a customized linearization table uniquely generated during calibration to take into account the unique impedance properties of a particular probe/coaxial cable configuration. During calibration, the probe is positioned adjacent a calibration target. The calibration target is selected to have the same material characteristics as the target to be monitored during actual operation of the transmitter in the field. At a fixed distance between the probe and calibration target, the resonant frequency of the probe/cable system is determined. Thereafter, utilizing this resonant frequency to excite the probe, the voltage response of the probe/cable system is determined as the distance between the probe and the target material is incrementally changed. The voltage output is used to build a table for incremental distances, wherein each distance is characterized by a non-linear output that has been equated to a linear output. This uniquely generated table is subsequently downloaded into the transmitter for reference during monitoring.