The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Jan. 18, 2006
James M. Cawood, Jr., Houston, TX (US);
Shrikant U. Kulkarni, Houston, TX (US);
Lun-kuang Liu, Houston, TX (US);
James M. Cawood, Jr., Houston, TX (US);
Shrikant U. Kulkarni, Houston, TX (US);
Lun-Kuang Liu, Houston, TX (US);
Celanese International Corporation, Dallas, TX (US);
Abstract
A method is disclosed for controlling a methanol carbonylation process for producing acetic acid. The method includes the steps of monitoring the rate of production of the acetic acid; reducing the production rate in response to a change in a process condition or a process equipment condition; after the production rate is reduced, controlling the process at the reduced production rate; and increasing the production rate after the condition change has been addressed until at least the production rate returns to a normal operating range; wherein during at least one of the steps of reducing the production rate, controlling the process at the reduced production rate, and increasing the production rate until the production rate returns to a normal operating range, the process is controlled by nonlinear multivariable control based on a model of the process. Also disclosed is a process for producing acetic acid, in which at least a reaction section of the process is controlled using a multivariable nonlinear predictive controller based on a nonlinear model of the process. Control of the process is based on the same model during normal operations, during process-upset conditions and also during a recovery period after the upset has been addressed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile