The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Jun. 04, 2007
Morteza Safai, Seattle, WA (US);
Gary E. Georgeson, Federal Way, WA (US);
James H. Lee, Ravensdale, WA (US);
Scott W. Lea, Renton, WA (US);
Morteza Safai, Seattle, WA (US);
Gary E. Georgeson, Federal Way, WA (US);
James H. Lee, Ravensdale, WA (US);
Scott W. Lea, Renton, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Optical metrology methods, apparatuses, and systems for detecting seal integrity. These comprise changing an air pressure inside a chamber to an excitation pressure level when the chamber is placed over a segment of a surface of a structure having one or more seal features and determining whether the integrity of any of the one or more seal features has been compromised by determining, using an optical system, whether any of the one or more seal features have been deformed by the changing of the air pressure.