The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Jul. 31, 2008
Chih-chien Tsai, Taipei Hsien, TW;
Su-der Wu, Taipei Hsien, TW;
Yu-chieh Liao, Taipei Hsien, TW;
Chau-lin Chang, Taipei Hsien, TW;
Chih-Chien Tsai, Taipei Hsien, TW;
Su-Der Wu, Taipei Hsien, TW;
Yu-Chieh Liao, Taipei Hsien, TW;
Chau-Lin Chang, Taipei Hsien, TW;
Foxnum Technology Co., Ltd., Tucheng, Taipei County, TW;
Abstract
A measuring apparatus is provided for measuring a diameter of a hole. The measuring apparatus includes a sensor unit, a data processing unit, and a display unit. The sensor unit includes a probing member. The probing member includes a plurality of probes with contact ends being arranged on a circumference, and a plurality of angle sensors. The probes are capable of contacting the inner surface of the hole. The angle sensors are arranged on each of the probes to obtain digitally an angle value of each splaying probe contacting the inner surface of the hole. The data processing unit is configured for receiving the angle value generated by the sensor unit and computing the diameter of the hole according to the value of an angle. The display unit is configured for displaying the diameter computed by the data processing unit. A method is also provided for using the measuring apparatus.