The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2010

Filed:

Jun. 06, 2007
Applicant:

Peter Kenneth Hellier, Dursley, GB;

Inventor:

Peter Kenneth Hellier, Dursley, GB;

Assignee:

Renishaw PLC, Wotton-under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/004 (2006.01);
U.S. Cl.
CPC ...
Abstract

A 'go, no-go' method is described for determining whether the dimensions of an object, such as a workpiece, conform to tolerance. The method uses a measurement probe, such as a touch trigger, analogue, or non-contact probe, mounted on a measuring apparatus such as a coordinate measuring machine, machine tool, or a lathe. The method comprises the step of driving the measurement probe around a path relative to the object, said path being based on a tolerance of the object. The path relative to the object may include at least a first path based on the maximum tolerance of the object and a second path based on the minimum tolerance of the object. The method additionally comprises the steps of monitoring any probe measurement data acquired by the measurement probe as the probe is driven around the path, and indicating if the dimensions of the object do not conform to tolerance only if there is a change in state of the probe measurement data that is acquired as the measurement probe is driven around the path.


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