The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2010

Filed:

Sep. 21, 2005
Applicants:

Piotr Findeisen, Plano, TX (US);

Yanhua LI, Sunnyvale, CA (US);

Joseph A. Coha, San Jose, CA (US);

David I. Seidman, San Francisco, CA (US);

Inventors:

Piotr Findeisen, Plano, TX (US);

Yanhua Li, Sunnyvale, CA (US);

Joseph A. Coha, San Jose, CA (US);

David I. Seidman, San Francisco, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 9/45 (2006.01); G06F 9/46 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment relates to a method for identifying sources of memory retention in an executing application. A size of a set of objects is tracked over multiple periods. A period is determined to be a growth period if the size for the set of objects increases above a previous maximum size, and the number of growth periods is counted. The set of objects is flagged as having potential undesired object retention (a memory leak) if the number of growth periods is greater than a threshold number. Other embodiments are also disclosed.


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