The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2010
Filed:
Apr. 27, 2009
Applicant:
Tomoko Nobekawa, Osaka, JP;
Inventor:
Tomoko Nobekawa, Osaka, JP;
Assignee:
Panasonic Corporation, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method is provided for testing a semiconductor integrated circuit by utilizing a scan path circuit provided to detect the degeneracy fault in the semiconductor integrated circuit, and bringing scan chains to states in which shift resistor operations can be effected for the input of patterns by which a glitch fault and the IR-DROP fault between the scan chains can be detected.
Quick Actions:
Nobekawa, Tomoko. (2010). Method for testing semiconductor integrated circuit and method for verifying design rules (U.S. Patent No. 7765446). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7765446
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile