The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2010
Filed:
Jun. 15, 2007
Yantao LI, Beijing, CN;
Guowei Liu, Beijing, CN;
Haidong Zhang, Beijing, CN;
Adnan Azfar Mahmud, Kirkland, WA (US);
Bing Sun, Beijing, CN;
Min Wang, Beijing, CN;
Wenli Zhu, Beijing, CN;
Jian Wang, Beijing, CN;
Yantao Li, Beijing, CN;
Guowei Liu, Beijing, CN;
Haidong Zhang, Beijing, CN;
Adnan Azfar Mahmud, Kirkland, WA (US);
Bing Sun, Beijing, CN;
Min Wang, Beijing, CN;
Wenli Zhu, Beijing, CN;
Jian Wang, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
Described is a technology by which high dimensional data may be efficiently analyzed, including by filtering, grouping, aggregating and/or sorting operations to provide an analysis result. For efficiency in the analysis, an inverted index may be built (e.g., as part of filtering), and/or a hash structure (e.g., as part of grouping). Analysis parameters specify dimensions, on which union and/or intersection operations are performed to provide a final dataset. The analysis tool provides a user interface for inputting analysis parameters and outputting information corresponding to an analysis result. The analysis tool may sort the information corresponding to the analysis result, e.g., to output the topmost or bottommost results.