The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2010

Filed:

Jul. 19, 2007
Applicants:

Jerry Z. Shan, Palo Alto, CA (US);

Julie W. Drew, Redwood City, CA (US);

Jose Luis Beltran Guerrero, Palo Alto, CA (US);

Inventors:

Jerry Z. Shan, Palo Alto, CA (US);

Julie W. Drew, Redwood City, CA (US);

Jose Luis Beltran Guerrero, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

To perform forecasting, a first data collection having data values at first intervals is received, and a first forecasting model is built based on the first data collection. A second forecasting model is built based on a second data collection having intervals aggregated from intervals of the first data collection, wherein the second forecasting model is at a different aggregation level than the first forecasting model. At least one metric is computed by performing at least one test based on at least one of the first and second data collections to indicate which of the first and second forecasting models has a better forecast quality.


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